提出一种基于一维线衍射光栅的焦斑重构和远场测量新方法,从理论上分析了新方法在拓展测量仪器动态范围、提取远场焦斑高频旁瓣信息的有效性及方法的适用条件。基于实验室现有的一套远场测量系统平台及自行设计的一维线衍射光栅,以远场环围能量(PIB)曲线作为检验新方法有效性的指标,通过数值仿真和实验相结合考察了新方法的有效性,并从准确测量远场焦斑质量的角度探讨了不同减阈值的去噪方式对焦斑重构结果的影响,对结果进行了分析讨论。 A new method of focal spot reconstruction and far-field measurement based on one-dimensional line diffraction grating is proposed. The validity of the new method for expanding the dynamic range of measuring instruments and extracting the information of far-field sidelobes from far-field focal spots is theoretically analyzed The applicable conditions. Based on a set of far-field measurement system platform and one-dimensional line diffraction grating designed by ourselves, PII curve is used as an index to test the validity of the new method. Through numerical simulation and experiment, The effectiveness of the new method is also discussed. From the point of accurate measurement of the quality of the far-field focal spot, the effect of different threshold reduction methods on the focal spot reconstruction results is discussed. The results are analyzed and discussed.