A CMOS high resolution, process/temperature variation tolerant RSSI for WIA-PA transceiver

来源 :Journal of Semiconductors | 被引量 : 0次 | 上传用户:oracle_1984
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This paper presents a high resolution,process/temperature variation tolerant received signal strength indicator(RSSI) for wireless networks for industrial automation process automation(WIA-PA) transceiver fabricated in 0.18 μm CMOS technology.The active area of the RSSI is 0.24 mm2.Measurement results show that the proposed RSSI has a dynamic range more than 70 dB and the linearity error is within ±0.5 dB for an input power from-70 to 0 dBm(dBm to 50 Ω),the corresponding output voltage is from 0.81 to 1.657 V and the RSSI slope is12.1 mV/dB while consuming all of 2 mA from a 1.8 V power supply.Furthermore,by the help of the integrated compensation circuit,the proposed RSSI shows the temperature error within ±1.5 dB from-40 to 85 ℃,and process variation error within ±0.25 dB,which exhibits good temperature-independence and excellent robustness against process variation characteristics. This paper presents a high resolution, process / temperature variation tolerant received signal strength indicator (RSSI) for wireless networks for industrial automation process automation (WIA-PA) transceiver fabricated in 0.18 μm CMOS technology. The active area of ​​the RSSI is 0.24 mm2. Measurement results show that the proposed RSSI has a dynamic range more than 70 dB and the linearity error is within ± 0.5 dB for an input power from-70 to 0 dBm (dBm to 50 Ω), the corresponding output voltage is from 0.81 to 1.657 V and the RSSI slope is 12.1 mV / dB while consuming all of 2 mA from a 1.8 V power supply. Hotmore, by the help of the integrated compensation circuit, the proposed RSSI shows the temperature error within ± 1.5 dB from-40 to 85 ° C, and process variation error within ± 0.25 dB, which exhibits good temperature-independence and excellent robustness against process variation characteristics.
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