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为了研究最大取向值Q的大小对晶粒生长的元胞自动机模拟过程及结果的影响,对Q值分别取30、50、70、100、150、200时进行了模拟分析。结果表明,Q值较小时晶粒生长过程中极易发生晶粒碰撞现象导致晶粒异常长大,当Q值大于100时模拟过程平稳且符合晶粒生长理论,当Q值大于150时对模拟过程没有显著影响。不同Q值时晶粒的生长指数相差很小,且与其他研究者给出的生长指数十分接近,说明模拟过程是可信的。
In order to study the influence of the maximum orientation value Q on the cellular automaton simulation process and the result of grain growth, the simulation analysis was carried out when the Q values were taken as 30, 50, 70, 100, 150 and 200, respectively. The results show that when the Q value is small, the grain collision easily occurs during grain growth and lead to abnormal grain growth. When the Q value is greater than 100, the simulation process is stable and consistent with the theory of grain growth. When the Q value is greater than 150, The process did not have a significant effect. At different Q values, the growth index of grains is very small and close to the growth index given by other researchers, indicating that the simulation process is credible.