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在X-光衍射工作中,一些老式记录测试系统采用盖革计数管较为普遍。这种测试系统在定量分析时一般都要求进行死时间校正,修正测定的计数强度。一般测定记录系统死时间是多层箔方法,它的固有缺点是箔的厚度不匀且不易测准。为了克服这个缺点,我们改用一种新的单层箔技术,比较简便地测定了死时间τ。测定出τ之后,原则上可以校正X-光衍射积分强度。校正积分强度的通用方法是逐点校正,这种方法相当繁琐,因此只限于少量精密程度要求较高的工作才采用。在大量贯常物相定量分析的工作中,由于
In the X-ray diffraction work, some older recording test systems use Geiger counter tubes more commonly. This test system in the quantitative analysis are generally required to carry out dead time correction, the determination of the measured intensity correction. The typical measurement record system dead time is a multi-layer foil method which inherently has the disadvantage of uneven foil thickness and poor calibration. In order to overcome this shortcoming, we use a new single-layer foil technique to measure the dead time τ relatively easily. After the determination of τ, it is in principle possible to correct the X-ray diffraction integral intensities. The common method of correcting integral strength is point-by-point correction, which is a tedious process and is therefore limited to a small number of highly demanding tasks. In a large number of regular phase quantitative analysis of the work, due