一.前言随着我国科学技术的发展,工农业各条战线,特别是国防尖端技术都广泛地采用了电子新技术,这对电子元、部件的寿命与可靠性提出了更高的要求。对长寿命管来说,采用通常的例行寿命试验方法,花费的时间太长,消耗人力、物力也太大。如对于一般5000小时的长寿命管,寿试结果的获得最少也得花八个月之久,因此,现有的寿命试验方法与长寿命管生产远远不相适应。 I. Introduction With the development of science and technology in our country, new technologies for electronics have been widely adopted in all fronts of industry and agriculture, especially the most advanced national defense technologies. This has put forward higher requirements on the service life and reliability of electronic components and parts. For the long life tube, the usual routine life test method takes too long, consumes manpower and material resources too much. For example, for a typical 5000-hour long life tube, the life test result may take at least eight months. Therefore, the existing life test method is far from compatible with the long life tube production.