位相测量轮廓术（PMP）是将被测物体表面投影光栅条纹的灰度分布变换为位相分布，从而求得被测物体高度分布的轮廓测量技术。本文讨论PMP测量系统参数：抽样间隔X、Y；光栅周期p、q；最大系统噪声nmax以及光瞳位置参数d、L的选择和测定。这些参数的合理选择与精确测定，将提高位相测量以及位相-高度转换的精度。 The phase measurement profilometry (PMP) is a contour measurement technique that transforms the grayscale distribution of the projected grating fringes on the surface of a measured object into a phase distribution so as to obtain the height distribution of the measured object. This article discusses the PMP measurement system parameters: sampling interval X, Y; grating period p, q; maximum system noise nmax and pupil position parameters d, L selection and determination. Reasonable selection and accurate determination of these parameters will improve the accuracy of phase measurements and phase-height conversions.