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本文分析287例非先天愚型低智儿的掌轴值(atd角及/或tPD),结果:(1)阳性率显著高于正常同龄儿(P<0.001～0.05);(2)有遗传背景者阳性率更高,(3)掌轴值阳性患儿父母(表型正常)的该值也显著高于正常成人;(4)亲子两代atd的遗传呈因果正相关,其遗传力依次为双亲>父>母;(5)家系调查发现双亲中至少.1人掌轴值阳性,1～3级亲属也有散在阳性者;(6)掌轴值阳性较染色体脆性增高的遗传意义大。以上各项均支持掌轴值阳性与遗传有关;(7)掌轴值容易测量,可作为低智的遗传普筛、优生学的遗传咨询及低智患者遗传病因的一种辅助诊断方法。
In this study, we analyzed the atz angles and / or tPD in 287 non-idiotypic children with low intelligence. Results: (1) The positive rate was significantly higher than that of normal peers (P <0.001-0.05); (2) (3) The value of the parents (normal phenotype) in children with atropisperium was also significantly higher than that in normal adults; (4) the genetic causation of atd in both parents was positive and the heritability was in turn (5) pedigree survey found that at least one person in the parents of the palm axis value was positive, 1 to 3 relatives also scattered positive; (6) the value of the spindle axial chromosomes higher than the genetic significance of increased brittleness. All of the above support the positive value of hand axis and genetic related; (7) the value of the hand axis easy to measure, can be used as low-Chi genetic screening, eugenics genetic counseling and low-Chi patients with genetic diagnosis of an auxiliary diagnosis.