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,Damage effects and mechanism of the silicon NPN monolithic composite transistor induced by high-pow
[期刊论文] 作者：Hui Li,Chang-Chun Chai,Yu-Qian Liu,Han Wu,Yin-Tang Yang,
来源：中国物理B（英文版） 年份：2018
A two-dimensional model of the silicon NPN monolithic composite transistor is established for the first time by utilizing the semiconductor device simulator, Se...
,Damage effect and mechanism of the GaAs high electron mobility transistor induced by high power mic
[期刊论文] 作者：Yang Liu,Chang-Chun Chai,Yin-Tang Yang,Jing Sun,Zhi-Peng Li,
来源：中国物理B（英文版） 年份：2016
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,Analysis of the damage threshold of the GaAs pseudomorphic high electron mobility transistor induce
[期刊论文] 作者：Xiao-Wen Xi,Chang-Chun Chai,Yang Liu,Yin-Tang Yang,Qing-Yang Fan,Chun-Lei Shi,
来源：中国物理B（英文版） 年份：2016
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[期刊论文] 作者：Xiao-Wen Xi,Chang-Chun Chai,Gang Zhao,Yin-Tang Yang,Xin-Hai Yu,Yang Liu,
来源：中国物理B（英文版） 年份：2016
...
[期刊论文] 作者：Qi-Wei Li,Jing Sun,Fu-Xing Li,Chang-Chun Chai,Jun Ding,Jin-Yong Fang,
来源：中国物理B（英文版） 年份：2021
The damage effect characteristics of GaAs pseudomorphic high electron mobility transistor (pHEMT) under the ir-radiation of C band high-power microwave (HPM) is investigated in this paper.Based on the theoretical analysis,the thermoelectric......
,Physics-based analysis and simulation model of electromagnetic interference induced soft logic upse
[期刊论文] 作者：Yu-Qian Liu,Chang-Chun Chai,Yu-Hang Zhang,Chun-Lei Shi,Yang Liu,Qing-Yang Fan,Yin-Tang Yang,
来源：中国物理B（英文版） 年份：2018
The instantaneous reversible soft logic upset induced by the electromagnetic interference (EMI) severely affects the performances and reliabilities of complemen...
,Investigation on latch-up susceptibility induced by high-power microwave in complementary metal-oxi
[期刊论文] 作者：Yu-Hang Zhang,Chang-Chun Chai,Xin-Hai Yu,Yin-Tang Yang,Yang Liu,Qing-Yang Fan,Chun-Lei Shi,
来源：中国物理B（英文版） 年份：2017
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[期刊论文] 作者：Yu-Hang Zhang,Chang-Chun Chai,Yang Liu,Yin-Tang Yang,Chun-Lei Shi,Qing-Yang Fan,Yu-Qian Liu,
来源：中国物理B（英文版） 年份：2017
The thermal failure induced by high power microwave (HPM) in a complementary metal oxide semiconductor (CMOS) inverter is investigated and its dependence on mic...
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