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NEW TECHNOLOGY FOR FAULT DIAGNOSIS BASED ON WAVELET DENOISING AND MODIFIED EXPONENTIAL TIME-FREQUENC
[期刊论文] 作者：Wang Xinqing,Wang Yaohua,Qian Shuhua,Chen Liuhai,Xu Yanshen,Zhao Xiangsong,
来源：机械工程学报(英文版) 年份：2001
Fast wavelet multi-resolution analysis (wavelet MRk)provides a effective tool for analyzing and canceling disturbing components in original signal. Because of i...
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