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[会议论文] 作者:De-Sheng Kong,Wen-Hua Lu,Yuan-Yuan Feng, 来源:The 60th Annual Meeting of The International Society of Elec 年份:2009
By using electrochemical measurement techniques and based on the point-defect model (PDM),this work studied the point-defect conductive property of the n-type semiconducting anodic oxide film formed o...
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