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[期刊论文] 作者：BinggangFeng,BiaoDeng,YuqiRen,YudanWang,GuohaoDu,HaiTan,YanlingXue,andTiqiaoXiao,
来源：ChineseOpticsLetters 年份：2016
Full-field x ray nano-imaging (FXNI) is one of the most powerful tools for in-situ, non-destructive observation of the inner structure of samples at the nanoscale. Owing to the high flux density of the third-generation synchrotron radiation......
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