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Nano-scale Characterization of Nitrides using Helium Temperature Scanning Transmission Electron Micr
[会议论文] 作者：J.Christen,
来源：The 13th International Conference on Physics of Light-Matter 年份：2012
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Nano-scale Characterization of Nitrides using Helium Temperature Scanning Transmission Electron Micr
[会议论文] 作者：J.Christen,
来源：The 13th International Conference on Physics of Light-Matter 年份：2012
...
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