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[期刊论文] 作者:Zhu Zhi-Wei,Gao Xin-Dong,Zhang Zhi-Bin,Piao Ying-Hua,Hu Cheng,Zhang David-Wei,Wu Dong-Ping, 来源:中国物理B(英文版) 年份:2012
In this paper we investigate the formations and morphological stabilities of Co-silicide films using 1 8-nm thick Co layers sputter-deposited on silicon (100) s...
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