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[会议论文] 作者:Deng Xie[1],Zhi Ren Qiu[2],Bin Xin[3],Ren-Xu Jia[3],Yu-Ming Zhang[3],Huirong Su[4],Ting Mei[5],Zhe Chuan,
来源:第一届全国椭圆偏振光谱学研讨会 年份:2014
We have measured a series of 3C-SiC on 4H-SiC structure thin film samples with different growth temperature at room temperature using J.A.Woollam M-2000 spectro...
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