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,Working Pressure Dependence of Properties of Al2O3 Thin Films Prepared by Electron Beam Evaporation
[期刊论文] 作者：ZHAN Mei-Qiong,Wu Zhong-Lin,FAN Zheng-xiu,
来源：中国物理快报(英文版) 年份：2008
The effects of working pressure of Al2O3 thin films are investigated.Transmittance of the Al2Oa thin film is measured by a Lambda 900 spectrometer.Laser-induced...
[期刊论文] 作者：TAN Tian-Ya,ZHANG Da-Wei,ZHAN Mei-Qiong,SHAO Jian-Da,FAN Zheng-Xiu,
来源：中国物理快报（英文版） 年份：2005
ZrO2 thin films were deposited by using an electron beam evaporation technique on three kinds of lithium triborate (LiB3O5 or LBO) substrates with the surfaces...
,optical, Structural and Laser-Induced Damage Threshold Properties of HfO2 Thin Films Prepared by El
[期刊论文] 作者：ZHAN Mei-Qiong,Zhang Dong-Ping,TAN Tian-Ya,HE Hong-Bo,SHAO Jian-Da,FAN Zheng-Xiu,
来源：中国物理快报（英文版） 年份：2005
We prepare HfO2 thin films by electron beam evaporation technology. The samples are annealed in air after deposition. With increasing annealing temperature, it...
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