(CLP) 相关硕士博士期刊学术论文 - 搜论网

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Study on Test Compaction in High-Level Automatic Test Pattern Generation (ATPG) Platform

Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large......

期刊

Automatic TEST Pattern Generation (ATPG) CONSTRAINT Logic Programming (CLP) Veri

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