AtomicForceMicroscope(AFM)相关论文
The creation of Nanodots with combined-dynamic mode “dip-pen” nanolithography technology based on at
Dip-pen nanolithography (DPN), based on atomic force microscope (AFM) system, is an effective technique for nanoscale sc......
扫描探针显微镜(Scanning probe microscopy,SPM)是显微镜的一个分支,它利用物理探针扫描标本形成样本表面图像。而原子力显微镜(A......
