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The performance of the next-generation electronic devices based on Graphene is strongly influenced by the structure-function relationship.A novel technique which combines the best of two worlds, the high spatial resolution of Atomic Force Microscopy (AFM) and the analytical power of infrared spectroscopy makes now possible the nanoscale mapping of such nano-devices.The spatial resolution of about 10nm of nano-FTIR microscopy opens a new era for modem nano-analytical applications such as chemical identification, free-carrier profiling and plasmonic vector near-field mapping.