Although three-dimensional topological insulators(TI)exhibited good structural and electronic qualities,they were not very suitable for transport studies.
Using computational method to predict images taken by a helium ion microscope (HIM)and applying this to the images of graphene are important for developing nano-scaled devices[1].
Synchrotron radiation x-ray diffraction techniques,including reciprocal space mapping(RSM),crystal truncation rod(CTR),etc,are powerful tools to probe the crystal/domain structure of epitaxial films a