Improvements on Quantitative Nano Physical Properties Measurement

来源 :The 6th International Conference on Nanoscience and Technolo | 被引量 : 0次 | 上传用户：xiongwen0225

【摘要】

：

　　Physical properties at nanometer scale,including mechanical,electric and electronic properties,are highly demanded in today's research on materials for a va

【作者】

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WanxinSun;

【机构】

：

Bruker Nano Surface,11 Biopolis Way ＃10-10,The Helios,Singapore 138667

【出处】

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The 6th International Conference on Nanoscience and Technolo

【发表日期】

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2015年期

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　　Physical properties at nanometer scale,including mechanical,electric and electronic properties,are highly demanded in today's research on materials for a vast range of applications.Imaging technologies with nanometer spatial resolution are well developed and have been extensively used in material characterization for over two decades.For example,electron microscopes and atomic force microscopes(AFM)are frequently used instruments in nanomaterial characterization.

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Improvements on Quantitative Nano Physical Properties Measurement

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