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5. Analysis of Silica Dioxide Nanoparticles using Single Particle ICP-MS(SP-ICP-MS)

Analysis of Silica Dioxide Nanoparticles using Single Particle ICP-MS(SP-ICP-MS)

来源 :6th Asia-Pacific Winter Conference on Plasma Spectrochemistr | 被引量 : 0次 | 上传用户：bmw335

【摘 要】

：

　　The increasing use of SiO2 nanoparticles in a variety of products has fostered a need to accurately characterize them.SP-ICP-MS provides advantages over oth

【作 者】

：

KennethNeubauer[1]ChadyStephan[2]KyokoKobayashi[3]CharlesSchneider[1] 

【机 构】

：

PerkinElmer Inc.,Shelton,CT,USA

【出 处】

：

6th Asia-Pacific Winter Conference on Plasma Spectrochemistr

【发表日期】

：

2015年期

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论文部分内容阅读

　　The increasing use of SiO2 nanoparticles in a variety of products has fostered a need to accurately characterize them.SP-ICP-MS provides advantages over other nanoparticle characterization techniques and overcomes the main limitation of Si analysis with conventional ICP-MS.

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