Dark count is one of the inherent noise types in single-photon diodes, which may restrict the performances of detectors based on these diodes. To formulate better designs for peripheral circuits of such diodes, an accurate statistical behavioral model of dark current must be established. Research has shown that there are four main mechanisms that contribute to the dark count in single-photon avalanche diodes. However, in the existing dark count models only three models have been considered, thus leading to inaccuracies in these models. To resolve these shortcomings, the dark current caused by carrier diffusion in the neutral region is deduced by multiplying the carrier detection probability with the carrier particle current at the boundary of the depletion layer. Thus, a comprehensive dark current model is constructed by adding the dark current caused by carrier diffusion to the dark current caused by the other three mechanisms. To the best of our knowledge, this is the first dark count simulation model into which incorporated simultaneously are the thermal generation, trap-assisted tunneling, band-to-band tunneling mechanisms, and carrier diffusion in neutral regions to evaluate dark count behavior. The comparison between the measured data and the simulation results from the models shows that the proposed model is more accurate than other existing models, and the maximum of accuracy increases up to 31.48％when excess bias voltage equals 3.5 V and temperature is 50 °C.