本文一般地介绍了 x 射线无损探伤的原理和方法。较详细地讨论了它在高频大功率晶体管研制中的应用。通过实验说明了,在大功率器件的管壳结构设计及工艺质量、管芯片烧结等方面,x 射线无损探伤是一种科学的简单的分析和检查方法,也是管壳制造工艺质量筛选或抽验的方法之 This paper generally introduces the principle and method of X-ray nondestructive testing. Discussed in more detail its application in the development of high-frequency high-power transistors. Experiments show that X-ray non-destructive flaw detection is a scientific and simple analysis and inspection method in the design of shell structure and process quality of high-power devices, tube chip sintering, etc., and is also the screening or sampling of tube manufacturing process quality Method