利用北京同步辐射装置(BSRF) 3W1B束线及反射率计靶室,在束流强度40～120mA、贮存环电子能量2GeV专用光运行模式下,做了不同材料掠入射平面镜反射率标定实验。标定过程用高灵敏度无死层的硅光二极管代替X射线二极管(XRD)作探测器,使输出信号提高2～3个量级,可标定能区从150～270eV拓展为50～1500eV能区,对C,Si和Ni材料平面镜给出完整的反射率标定曲线,最终把实验数据与理论计算比对并分析。 Using BSRF 3W1B beamline and reflectometer target chamber, the reflectivity calibration experiment of grazing incidence plane mirror with different materials under the beam intensity of 40 ~ 120mA and storage ring electron energy 2GeV special light operation mode was made. The calibration process replaces X-ray diode (XRD) detector with silicon photodiode with high sensitivity and no dead zone, which increases the output signal by 2 ~ 3 orders of magnitude. The calibration energy range can be expanded from 150 ~ 270eV to 50 ~ 1500eV energy range, The complete reflectivity calibration curve is given for the plane mirrors of C, Si and Ni materials. Finally, the experimental data are compared with the theoretical calculations and analyzed.