在区域勘查地球化学样品分析中,X射线荧光光谱(XRF)的工作已有不少报道,但大部分方法主要考虑精度和准确度,根据Plesh判据选择基体校正项,用康普顿散射线作内标加经验系数校正基体效应.这些方法有的要编制Plesh判据程序,有的引进基体校正和谱线重叠项很多,分析一个样品(24个元素)需30分钟左右,限制了方法的速度.本文制定了XRF快速测 In the field of geochemical exploration of regional exploration, there are many reports on the work of XRF. However, most of the methods mainly consider the accuracy and accuracy. According to the Plesh criterion, the matrix correction term is selected and the Compton scattering line As the internal standard plus empirical coefficients to correct the matrix effect. Some of these methods to prepare Plesh criterion program, and some introduction of the substrate correction and spectral overlap many, analysis of a sample (24 elements) takes about 30 minutes, limiting the method Speed. This paper developed a rapid measurement of XRF