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在自行研制的超高真空扫描隧道显微镜（ＵＨＶ－ＳＴＭ）基础上，利用信号调制技术，建立了表面功函数信息成像方法介绍ＳＴＭ功函数信息成像方法的原理，并利用该方法同时获得样品表面同一区域的形貌信息像和功函数信息像分别对高定向热解石墨（ＨＯＰＧ）的超结构表面、激光溅射Ｓｉ的ＨＯＰＧ表面和附有催化剂颗粒的ＨＯＧＰ表面进行了测量 结果表明，利用功函数信息成像技术可以实现区分样品表面的元素及其分布
On the basis of UHV-STM developed by ourselves, the principle of information imaging method of surface work function information was established by using signal modulation technique, and the information of STM work function information was introduced. At the same time, (HOPG) superconducting surface, HOPG surface of laser sputtered Si and HOGP surface with catalyst particles were measured. The results show that the work function Information imaging techniques enable the differentiation of the elements and their distribution on the sample surface