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对两个厂家的硅雪崩光电二极管(APD)作了热过应力试验,结果表明,APD,不管其如何复杂,但在电信网络中用于光纤传输系统,它们是有着合适的可靠性的。然而,人们观察到了其中一家APD有两种失效机理,即增加表面漏电流和局部早击穿,这是引起误码率增加或造成整个系统失效的原因。结果指出,需要提供技术规范以防止传输系统采用不可靠的APD。最后,推荐处理方法和提几点建议。
Thermal over stress tests on two manufacturers of silicon avalanche photodiodes (APDs) showed that APDs, regardless of their complexity, are suitable for use in fiber optic transmission systems in telecommunications networks. However, it has been observed that one of the APDs has two failure mechanisms, namely increasing the surface leakage current and local premature breakdown, which causes the increase of bit error rate or failure of the whole system. The results indicate that there is a need to provide technical specifications to prevent the transmission system from using unreliable APDs. Finally, recommended treatment and make some suggestions.