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本文对55例安氏Ⅱ类1分类错合患者的X线头颅侧位片分别做Steiner臂章和Tweed分析法比较,计算矫正下前牙位置所需间隙量,并分组进行统计学分析。结果表明:当SNA和SNB角均正常时,两者结果无差异;当SNA或SNB角异常时,Steiner臂章分析法所需间隙量大于Tweed分析法(P<0.05)。本文提示在矫治安氏Ⅱ类错 时不能单凭Steiner或Tweed分析法就制订出治疗方案。
In this paper, 55 cases of Class Ⅱ division 1 malocclusion X-ray cephalometric films were done Steiner arm and Tweed analysis method to calculate the amount of space required to correct the anterior tooth under the position, and the group for statistical analysis. The results showed that there was no difference between SNA and SNB. When SNA or SNB angle was abnormal, the amount of clearance required by Steiner armor analysis method was greater than Tweed analysis (P <0.05). This paper suggests that in the treatment of Class Ⅱ Corrigendum, Steiner or Tweed analysis alone can not formulate a treatment plan.