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飞行时间二次离子表面质谱能对航天材料上肉眼可见微量污染物实现包括元素、同位素和各种化合物在内的指纹鉴别,特别是样品量有限航天器污染成份分析的理想手段。本文重点讨论如何从带有金一次离子源的飞行时间二次离子像中提取有关航天器污染的信息。由于飞行时间二次离子质谱独具的并行质量登录能力,二次离子表面像上每一像素都储存着完整的质谱,任意质量的二次离子像都可重构。与四极和磁二次离子质谱相比,飞行时间二次离子质谱更适于复杂航天器污染物的成像分析。
Time-of-flight secondary ion surface mass spectrometry (LC-MS) can be used to identify the trace contaminants visible to aerospace materials, including fingerprints of elements, isotopes and various compounds, especially for the analysis of limited samples of spacecraft contaminants. This article focuses on how to extract information about spacecraft contamination from time-of-flight secondary ion images with gold primary ion sources. Due to the unique parallel mass registration capability of TOF time-of-flight, a complete mass spectrum is stored for each pixel on the secondary ion surface image, and any secondary ion image of mass can be reconstructed. Compared with quadrupole and magnetodimonials, TOFIM is more suitable for imaging analysis of complex spacecraft contaminants.