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为了使晶体管能够工作十年以上而不至于损坏,需考虑很多可靠性的设计方案。在这方面各种意见讨论的结果已体现在关于微波晶体管各种金属化系统的优越性上。某些金属已经被认为是器件损坏的主要原因,于是成为引入注目的焦点。新近在弗拉西和加布希恩论文中建议采用金金属化来解决金属化问题。波尔已经发表了用大晶粒玻璃钝化的铝系统之优越性等有关报导,他得出的数据满足现有 MTF(平均失效时间)的要求。
In order for the transistor to work more than ten years without damage, many reliability designs are considered. The results of various discussions in this regard have been reflected in the superiority of various metallization systems for microwave transistors. Some metals have been considered as the main cause of device damage and have become the focus of attention. Recently in the Frasy and Gabushien thesis proposed gold metallization to solve the problem of metallization. Bol has published reports on the superiority of large-grain glass-passivated aluminum systems, and he has come up with data that meet the current MTF (Mean Time Between Failure) requirements.