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Many reconfiguration schemes for fault-tolerant binary tree architectures have been proposed in the lite..t.re[1-6]. The VLSI layouts of most previous studies are based on the classical H-tree layout, resulting in low area utilization and likely an unnecessarily high manufacturing cost simply due to the waste of a significaot portion of silicon area. In this paper, we present an area-efficient approach to the reconfigurable binary tree architecture. Area utilization and interconnection complexity of our design compare favorably with the other known approaches. In the reliability analysis, we take ioto arcount the faCt that accepted chips (after fabrication) are with dmereot degrees of redundancy initially, so as to obtain results which better reflect real situations.
Many reconfiguration schemes for fault-tolerant binary tree architectures have been proposed in the lite..t.re [1-6]. The VLSI layouts of most previous studies are based on the classical H-tree layout, resulting in low area utilization and likely annecessarily high manufacturing cost simply due to the waste of a significant part of silicon area. In this paper, we present an area-efficient approach to the reconfigurable binary tree architecture. Area utilization and interconnection complexity of our design compare favorably with the other In the reliability analysis, we take ioto arcount the faCt that accepted chips (after fabrication) are with dmereot degrees of redundancy initially, so as to obtain results which better reflect real situations.