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调制度测量轮廓术是一种垂直测量的三维面形测量方法,可以测量表面有剧烈变化的复杂物体。提出了一种基于正交方向空间载频的快速调制度测量轮廓术。该方法将两个具有一定间距且正交的正弦光栅同时成像在被测物体上,并使被测物体位于两个光栅成像面之间。采用空间频域滤波将正交光栅图像分离,得到被测物体经正交光栅调制的两个调制度图像,利用其比值和高度的对应关系恢复出物体高度。该方法只需采集一幅图像,即可恢复出物体高度,具有三维信息实时采集的特点。实验结果表明,利用该方法可以快速且较为准确地恢复出物体的高度信息。
Modulation measurement profilometry is a vertical measurement of three-dimensional surface measurement method that can measure the surface of complex objects with dramatic changes. A fast modulation measurement profile based on orthogonal direction space carrier frequency is proposed. In the method, two regularly spaced and orthogonal sinusoidal gratings are imaged on the measured object at the same time, and the measured object is located between two grating imaging planes. The space-frequency filtering is used to separate the orthogonal raster images, and the two modulation images modulated by the orthogonal raster of the measured object are obtained. The height of the object is restored by using the corresponding relationship between the ratio and the height. The method only needs to collect an image to recover the height of the object and has the characteristics of real-time collection of three-dimensional information. Experimental results show that this method can quickly and accurately retrieve the object’s height information.