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为了发挥小仪器的效能,我们试验了用0.5米平面光栅摄谱仪测定低含量锡。采用正交设计选择了主要摄谱条件。测定下限为0.003%。对锡含量为0.134%和0.011%的试样进行7次测定,相对标准偏差分别为7%和8%。用本法测定管理样以及与其它方法结果对照,结果基本吻合。一、仪器及工作条件WSP-2型0.5米平面光栅摄谱仪。三透镜
In order to give play to the performance of small instruments, we tested the determination of low levels of tin using a 0.5-meter planar grating spectrograph. Orthogonal design was used to select the main spectral conditions. The lower limit of determination is 0.003%. Seven determinations were performed on samples containing 0.134% and 0.011% tin with relative standard deviations of 7% and 8%, respectively. Using this method to determine the management of samples and other methods and control results, the results are basically consistent. First, the instrument and working conditions WSP-2 0.5-meter plane grating spectrograph. Three lenses