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1.引言光学薄膜的测量,是薄膜技术中十分重要而内容又极其丰富的课题。就科学技术发展的广义角度讲,测量技术是必不可少的“耳目”。量子论的创立者普朗克(M.Planck)曾指出:“物理知识的进步显然和物理仪器的精确度,以及使用量度的技术有密切的关系”(《从近代物理学来看宇宙》)。从光学薄膜的特殊性讲,“测量”既冠于薄膜镀制之前,又尾随薄
1. Introduction The measurement of optical thin films is a very important issue in thin film technology with an extremely rich content. In the broad sense of the development of science and technology, measurement technology is indispensable “eyes and ears”. M.Planck, the founder of the quantum theory, once pointed out: “The advancement of physical knowledge is obviously closely related to the precision of physical instruments and the technique of using them” (“The Universe from Modern Physics”) . From the particularity of the optical film, “measurement” is both preceded by the thin film before plating, followed by thin