本文通过对电离层形态结构的分析以及建立适当的模型来讨论电离层折射对干涉仪输出的影响,并提出了改正方案。在讨论过程中,作者考虑了层下点在赤纬方向的运动,并提出了一种把电离层预报值与实测值结合起来修正层下点处f_0F_2的方案。这些工作虽然是针对密云米波系统的,但这些方法中的某些考虑可以推广到一般的电离层折射误差改正中去。 In this paper, the ionospheric morphological structure analysis and the establishment of an appropriate model to discuss the impact of ionospheric refraction on the output of the interferometer, and propose a correction program. During the discussion, the author considered the motion of the layer point in the declination direction and proposed a scheme of correcting the f_0F_2 at the layer point by combining the forecast value of the ionosphere with the measured value. Although these work is directed at the Mimpanic Microphone system, some of these methods can be generalized to normal ionospheric refractive error correction.