论文部分内容阅读
本文介绍双曝光全息干涉法对3J53膜片的材料质量、机械性能和装配工艺的检测。结果表明试验值与理论位基本一致,膜片的位移变化呈线性关系。
This article describes the double exposure holographic interferometry on the 3J53 diaphragm material quality, mechanical properties and assembly process testing. The results show that the experimental value is basically consistent with the theoretical position, the displacement of the diaphragm has a linear relationship.