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图2中的b和c为图a的改进电路。图2b是在图2a的基础上,将隔离电阻改为隔离二极管,适用于电压翻转电路有多路触发电压输入的电路中,以便将各路故障检测电路的触发电路隔离,避免互相影响。图2c是在图2a的基础上,将隔离电阻改为稳压二极管,取样检测电路也增加了VD3和R6、C1,这种检
B and c in Figure 2 for the improved circuit of Figure a. Figure 2b is based on Figure 2a, the isolation resistance is changed to isolation diodes for voltage flip-flop circuit has multiple trigger voltage input in order to separate the fault detection circuit of the trigger circuit isolation, to avoid mutual influence. Figure 2c is based on Figure 2a, the isolation resistance is changed to Zener diode, sampling and detection circuit also added VD3 and R6, C1, this test