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全息照相干涉测量术是对透明固体、液体和气体折射率的变化进行形象化的的测量的一种新的很有前途的分析方法。它最重要的用途是测量变形,测量精度达0.1微米量级以上。毗连的表面区的不规则变形作为被检验试样内部的不均匀和缺陷的间接证据。全息照相干涉测量术还能检验用其它方法(如超声法和x射线法)不能检验的缺陷。 Eumig HT-10全息照相干涉测量仪是实现全新的、有专利权的技术的仪器。其主要
Holographic interferometry is a new and promising analytical method for the visualization of changes in the refractive index of transparent solids, liquids and gases. Its most important use is to measure deformation, measurement accuracy of 0.1 microns and above. The irregular deformation of the adjoining surface area serves as indirect evidence of inhomogeneities and defects in the interior of the test specimen. Holographic interferometry can also detect defects that can not be inspected by other methods, such as sonography and x-ray methods. The Eumig HT-10 Holographic Interferometer is a new, patented technology instrument. Its main