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建立了一个微机控制的 LD 特性测量系统。本文重点介绍了系统设计、各部件的功能和有关软件,并且给出了若干实验结果。实验表明,微机测试技术比原有的测试技术好得多,在半导体激光器的制造和应用领域有着广泛的用途。
The establishment of a computer-controlled measurement of LD characteristics of the system. This article focuses on the system design, the various components of the function and the software, and gives a number of experimental results. Experiments show that the microcomputer test technology is much better than the original test technology and has a wide range of uses in the field of semiconductor laser manufacturing and application.