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如何给各种热界面上的温度计算提供一个快速又方便的设计方法?用红外辐射法或V_(BE)法能否更精确测量热阻?红外辐射法如何进行测量?怎样降低总热阻?在直流到射频范围热阻是否随温度或电压驻波比而变化?下面将回答这些问题。如果为了延长工作寿命而把结温降到最低,对大功率晶体管就必须全面降低热阻。从结温对平均失效时间的影响指出(图1):如果把结温保持在足够低的值,那么功率放大晶体管的寿命可超过500000小时。若热流区的每个热阻的阻值已知,则温度可按下式很快地计算出来(图3):
How to provide a fast and convenient design method for the temperature calculation of various thermal interfaces? Can the thermal resistance be measured more accurately by the infrared radiation method or the V_ (BE) method? How to measure the infrared radiation method? How to reduce the total thermal resistance? Will the thermal resistance vary with temperature or voltage standing wave ratio in the DC to RF range? These questions are answered below. If in order to extend the working life of the junction temperature to a minimum, for high-power transistors must be fully reduced thermal resistance. From the effect of junction temperature on the mean dead time (Figure 1): If the junction temperature is kept low enough, the power amplifier transistor can last for more than 500,000 hours. If the resistance of each thermal resistance of the heat flow zone is known, the temperature can be quickly calculated as follows (Figure 3):