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本文提出了微处理器系统自测的设想。微处理器控制现在盛行的原因是系统结构易于改变(改变固件),模块化,对逻辑要求低,并能用微处理器集成电路片以低的成本达到高度自动化。但是,如果不采用印刷电路板,正是上述这些特点使微处理器的维修和测试将变得复杂而且浪费时间。本文提出了避免这些缺点的解决办法,并可在基本系统设计之内以较少的费用来实现。本文提出的是一个独特的周期性内部自测方案,将损坏失效隔离在小的逻辑块中。存储器的失效可以追寻到具体的集成电路器件。本文着重说明自测是微处理器系统整体的一部分。
This paper presents the idea of microprocessor system self-test. Microprocessor control is now prevalent because of the ease of changing system architecture (firmware changes), modularity, low logic requirements, and the high degree of automation available at low cost using microprocessor ICs. However, without the use of printed circuit boards, these features make microprocessor repair and testing complicated and time-consuming. This paper presents solutions to avoid these shortcomings and can be implemented with less expense within the basic system design. This article presents a unique periodic internal self-test scheme that isolates damage failures in small blocks of logic. Memory failure can be traced to specific integrated circuit devices. This article highlights self-test is part of the microprocessor system as a whole.