论文部分内容阅读
本文给出了WT55型1.25厘米体效应管加直流工作点,以环境温度为加速变量的寿命试验结果.器件的突然烧毁严重影响其可靠性,使失效率约为10~(-5)/小时.然而,试验表明,器件实际寿命可达数百万小时.高温直流功率负荷筛选能有效地淘汰早期失效器件,尤其是淘汰突然烧毁失效器件.选择适当的筛选条件,将使器件在40℃环境温度下工作时,获得低于1000菲特的失效率.文章讨论了筛选条件的选择.严格封帽前的镜检,对提高器件可靠性有积极意义.
In this paper, the life test results of WT55 1.25 cm body-effect transistor plus DC operating point with ambient temperature as the acceleration variable are given.The sudden burning of the device seriously affects its reliability and the failure rate is about 10 -5 / h However, tests show that the actual life of the device can reach millions of hours.High temperature DC power load screening can effectively eliminate early failure devices, especially the sudden elimination of failed devices.Select the appropriate screening conditions, the device will be 40 ℃ environment Temperature, the failure rate of less than 1000 Fettong was obtained.This article discussed the selection of screening conditions.It is meaningful to improve the reliability of the device by strictly inspecting the front of the cap.