本文提出三种方法,以解决单颗回摆照片上衍射斑点太少或“多余”时的物相鉴定问题,使单颗超微量物质的物相鉴定更加准确可靠。这三种方法是: 1.通过找出试样各晶面的方位与晶面指数之间的变换矩阵来鉴定物相。 2.通过测量底片上各衍射斑点所代表的各个晶面之间的夹角来鉴定物相。 3.通过数底片上各衍射环处所出现的衍射斑点数目来协助物相鉴定。 In this paper, three methods are proposed to solve the phase identification problem when there are too few or too many diffraction spots on a single back-swaying photo, which makes the phase identification of a single ultra-trace substance more accurate and reliable. The three methods are: 1. Identify the phase by finding the transformation matrix between the orientation of each crystal face of the sample and the facet index. 2. Identify the phase by measuring the angle between the individual crystal planes represented by the diffraction spots on the film. 3. Assist phase identification by counting the number of diffraction spots present at each diffraction ring on the film.