对于聚碳酸酯,在某些条件下由α径迹直径法得到的体蚀刻速度V_B比厚度法大。本文对这一差异的原因进行了探讨,实验方法及结果如下: 所用探测器材料是Lexan、朝阳1号和Makrofol-E三种聚碳酸酯。这些膜两面蚀刻性质相同,故采用双面蚀刻法。用各蚀刻时间t时的~(252)Cf裂片径迹直径φ与膜的厚差2V_Bt作图。所用蚀刻剂是6.25N NaOH、6.25N KOH、6.25N NaOH+0.05％烷基苯磺酸钠以及 For polycarbonate, the bulk etch rate V_B obtained by the alpha track diameter method under certain conditions is larger than the thickness method. This paper discusses the reasons for this difference. The experimental methods and results are as follows: The detector materials used are Lexan, Chaoyang No.1 and Makrofol-E. Etching properties of these films on both sides of the same, so the use of double-sided etching. The ~ (252) Cf slice track diameter φ at each etching time t is plotted against the film thickness difference 2V_Bt. The etchant used was 6.25 N NaOH, 6.25 N KOH, 6.25 N NaOH + 0.05% sodium alkyl benzene sulfonate and