采用X—射线衍射分析法检测面粉中滑石粉等有害物质,是利用矿物质与面粉的分子结构不同的特点,利用X射线衍射法快速确定面粉中含有的矿物质结构,直接检测滑石粉等有害物质结构。此方法具有快速、直接、准确的特点,有利于对大批量面粉中滑石粉等有害物质的快速检测。 The use of X-ray diffraction analysis of talc and other harmful substances in the flour, the use of the characteristics of the molecular structure of different minerals and flour, the use of X-ray diffraction method to quickly determine the mineral structure of the flour, direct detection of talc and other harmful Material structure. This method has a fast, direct and accurate features, is conducive to the rapid detection of talc and other harmful substances in large quantities of flour.