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研究了半导体激光二极管(LD)组件的使用寿命。模拟了在不同的环境条件下,对1310 nm LD组件进行了高低温循环寿命实验,建立了循环寿命的数学模型。结果表明:循环寿命与循环的温差、循环的速度成指数关系,通过测试LD组件在高温差、高循环速度条件下的循环寿命,外推器件正常工作条件下的循环寿命。得到了LD组件可靠性数据,为工艺设计人员提出量化数据。
The service life of a semiconductor laser diode (LD) module was studied. Simulated under different environmental conditions, 1310 nm LD modules were tested for high and low temperature cycle life, the mathematical model of the cycle life was established. The results show that the cycle life is an exponential relationship with the temperature difference and cycle speed of the cycle. The cycle life of the LD module under the condition of high temperature difference and high circulating speed is tested and the cycle life of the device is extrapolated under normal working conditions. Obtained LD component reliability data, proposed for process designers to quantify data.