一引言用蒙特卡洛方法处理合金中的电子散射和计算X射线强度,是电子探针分析工作的一大进展。为了使理论计算精度满足实际分析的需要,曾设计了计算模型。如志水隆一(1971)的工作,但所得计算结果同实验数据相比。误差显得太大。尤其对较轻元素的计算更不理想。这里,我们采用直接计算的随机模型,即直接根 I. INTRODUCTION The use of Monte Carlo methods for the treatment of electron scattering in alloys and the calculation of X-ray intensities is a major development of electronic probe analysis. In order to make the theoretical calculation accuracy meet the need of actual analysis, the calculation model has been designed. Such as Chi Shui Longyi (1971) work, but the calculated results compared with the experimental data. The error is too big. In particular, the calculations of lighter elements are less desirable. Here, we use a direct calculation of the stochastic model, that is, the direct root