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本工作设计并建立了一台温控涂层发射率的快速检测装置。所建装置的工作原理是基于测定待检测涂层的定向一半球向全反射率,从而再确定半球向全发射率。由于采用了辐射调制器,使待测的反射辐射和待测涂层的本身发射分开,故毋需知道待测涂层的温度。实际测定表明,此装置测试结果可靠,发射率的分辨力优于0.01。利用这台装置已测定了一些温控涂层的半球向发射率。本文给出了包铝铝合金光亮阳极氧化涂层的ε_h的检测结果。
This work designed and established a temperature control coating emissivity rapid detection device. The working principle of the device is based on the determination of the orientation of the coating to be detected hemispherical full reflectivity, so as to re-determine the hemisphere to full emissivity. Due to the use of a radiation modulator, the reflected radiation to be measured is separated from the emission of the coating to be measured, so that it is not necessary to know the temperature of the coating to be measured. The actual measurement shows that the device test results are reliable, the resolution of emissivity better than 0.01. The hemispherical emissivity of some temperature-controlled coatings has been determined using this device. This paper presents the test results of ε_h of bright anodized aluminum clad aluminum clad coatings.