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用散斑干涉计量方法测定位移首倡于1968年.十多年来,这种应用技术得到了迅速发展.此项新技术用到试样表面散斑图样的高分辨率照片.测试中,与试样不发生机械接触,也无需对试样表面作预处理.散斑法所用的光学系统比全息法简单得多.散斑法可望成为变形、位移、旋转与振动分析的一种有效方法.本文阐述应用二次曝光散斑照相测定二维变形的一种简易方法,给出实测结果,并述及有关的理论.
Displacement measurement using speckle interferometry was first advocated in 1968. For over a decade, this application of technology has been rapidly developed. This new technique uses high-resolution photographs of speckle patterns on the surface of the specimen. No mechanical contact occurs and no pretreatment of the sample surface is required. The optical system used for speckle detection is much simpler than holography, and speckle detection is expected to be an effective method for deformation, displacement, rotation and vibration analysis. In this paper, a simple method of determining the two-dimensional deformation by using the second-exposure speckle photography is described. The measured results are given, and the relevant theories are described.