论文部分内容阅读
通过分析CMOS集成电路光辐射机理,利用单光子探测技术,搭建针对CMOS电路光辐射采集平台;以运行固定指令的AT89C52微控制器为分析对象,分析密码芯片光辐射信息与其执行的操作及处理的数据存在的依赖性关系,同时也分析了不同工作电压对密码芯片光辐射的影响;通过对密码芯片光辐射进行分析,说明光辐射旁路分析对安全芯片构成了严重的威胁。
By analyzing the mechanism of optical radiation of CMOS integrated circuits and using single-photon detection technology, a platform for collecting optical radiation of CMOS circuits is set up. Taking the AT89C52 microcontroller running fixed instructions as the analysis object, the light radiation information of the cryptographic chips and its operation and processing are analyzed Data dependencies. At the same time, the influence of different working voltage on the optical radiation of the cryptographic chip is also analyzed. By analyzing the optical radiation of the cryptographic chip, the optical radiation bypass analysis poses a serious threat to the security chip.